{"id":8482,"date":"2026-05-22T17:39:39","date_gmt":"2026-05-22T14:39:39","guid":{"rendered":"https:\/\/avies.com\/urunler\/automatic-test-system\/"},"modified":"2026-05-22T17:39:39","modified_gmt":"2026-05-22T14:39:39","slug":"automatic-test-system","status":"publish","type":"urunler","link":"https:\/\/avies.com\/en\/product\/automatic-test-system\/","title":{"rendered":"Automatic Test System"},"content":{"rendered":"<section class=\"l-section wpb_row height_custom color_primary with_img\"><div class=\"l-section-img\" role=\"img\" data-img-width=\"1800\" data-img-height=\"693\" style=\"background-image: url(https:\/\/avies.com\/wp-content\/uploads\/2024\/03\/home-bg-01.jpg);\"><\/div><div class=\"l-section-h i-cf\"><div class=\"g-cols vc_row via_grid cols_2 laptops-cols_inherit tablets-cols_inherit mobiles-cols_1 valign_middle type_default stacking_default\"><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><div class=\"w-post-elm post_custom_field us_custom_052b6b24 type_text baslik_1 color_link_inherit\"><span class=\"w-post-elm-value\">ATS-100<\/span><\/div><h2 class=\"w-post-elm post_custom_field us_custom_e7e08225 type_text baslik_2 color_link_inherit\"><span class=\"w-post-elm-value\">Automatic Test System<\/span><\/h2><div class=\"wpb_text_column us_custom_c6fe7383\"><div class=\"wpb_wrapper\"><p><strong>High Performance<\/strong><br \/>\n<strong>Flexibility in Testing<\/strong><br \/>\n<strong>Moduler Architecture<\/strong><\/p>\n<\/div><\/div><div class=\"w-separator size_small\"><\/div><div class=\"wpb_text_column\"><div class=\"wpb_wrapper\"><p>ATS-100 is a next-generation automatic test platform designed for the validation of boards, subsystems, and electronic units.<\/p>\n<\/div><\/div><\/div><\/div><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><div class=\"w-post-elm post_image stretched\"><img loading=\"lazy\" decoding=\"async\" width=\"600\" height=\"360\" src=\"https:\/\/avies.com\/wp-content\/uploads\/2026\/05\/ats-100-img-01.png\" class=\"attachment-large size-large wp-post-image\" alt=\"\" srcset=\"https:\/\/avies.com\/wp-content\/uploads\/2026\/05\/ats-100-img-01.png 600w, https:\/\/avies.com\/wp-content\/uploads\/2026\/05\/ats-100-img-01-300x180.png 300w\" sizes=\"auto, (max-width: 600px) 100vw, 600px\" \/><\/div><\/div><\/div><\/div><\/div><\/section><section class=\"l-section wpb_row height_custom\"><div class=\"l-section-h i-cf\"><div class=\"g-cols vc_row via_grid cols_1 laptops-cols_inherit tablets-cols_inherit mobiles-cols_1 valign_top type_default stacking_default\"><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><div class=\"g-cols wpb_row via_grid cols_2 laptops-cols_inherit tablets-cols_inherit mobiles-cols_1 valign_top type_default stacking_default\" style=\"--gap:3rem;\"><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><div class=\"w-image align_none\"><div class=\"w-image-h\"><img decoding=\"async\" width=\"1024\" height=\"546\" src=\"https:\/\/avies.com\/wp-content\/uploads\/2026\/05\/ats-100-img-02.jpg\" class=\"attachment-large size-large\" alt=\"\" loading=\"lazy\" srcset=\"https:\/\/avies.com\/wp-content\/uploads\/2026\/05\/ats-100-img-02.jpg 1024w, https:\/\/avies.com\/wp-content\/uploads\/2026\/05\/ats-100-img-02-300x160.jpg 300w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/div><\/div><\/div><\/div><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><div class=\"wpb_text_column\"><div class=\"wpb_wrapper\"><p>The ATS-100 is built on a specialized 40U double-bay industrial cabinet architecture with a PXI modular instrument backbone, delivering a robust and scalable platform for executing end-to-end functional and diagnostic test coverage across LRU and SRU level hardware.<\/p>\n<p>The system integrates the VPC 9025TR Mass Interconnect interface, enabling fast, secure, and reliable connection of test adapters and supporting analog, discrete I\/O, and serial signal simulation and measurement capabilities.<\/p>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/section><section class=\"l-section wpb_row height_custom\"><div class=\"l-section-h i-cf\"><div class=\"g-cols vc_row via_grid cols_1 laptops-cols_inherit tablets-cols_inherit mobiles-cols_1 valign_top type_default stacking_default\"><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><div class=\"wpb_text_column\"><div class=\"wpb_wrapper\"><h4>Technical Specifications<\/h4>\n<\/div><\/div><div class=\"w-separator size_small\"><\/div><div class=\"wpb_text_column uruntablo\"><div class=\"wpb_wrapper\"><table>\n<tbody>\n<tr>\n<td style=\"vertical-align: top;\" rowspan=\"2\">DC Supply<\/td>\n<td>0-80 V \/ 0-42 A, 3360 W &#8211; 2 ch.<\/td>\n<\/tr>\n<tr>\n<td>0-35 V \/ 8.5 A, 300 W &#8211; 8 ch.<\/td>\n<\/tr>\n<tr>\n<td style=\"vertical-align: top;\" rowspan=\"2\">Electronic Load<\/td>\n<td>0-150 V \/ 0-300 A, 3000 W &#8211; 2 ch.<\/td>\n<\/tr>\n<tr>\n<td>0-60 V \/ 0-60 A, 300 W &#8211; 6 ch.<\/td>\n<\/tr>\n<tr>\n<td>Oscilloscope<\/td>\n<td>500 MHz, 5 GSa\/s &#8211; 4 analog &amp; 16 digital ch.<\/td>\n<\/tr>\n<tr>\n<td>Function Generator<\/td>\n<td>150 MHz, 2 GSa\/s, 14-bit &#8211; 2 ch.<\/td>\n<\/tr>\n<tr>\n<td style=\"vertical-align: top;\" rowspan=\"2\">Analog Signal Generator<\/td>\n<td>\u00b120 V, 500 mA, 14-bit &#8211; 8 ch.<\/td>\n<\/tr>\n<tr>\n<td>\u00b110 V, \u00b120 mA, 16-bit &#8211; 32 ch.<\/td>\n<\/tr>\n<tr>\n<td>High-Speed Digital I\/O<\/td>\n<td>200 MHz &#8211; 32 ch.<\/td>\n<\/tr>\n<tr>\n<td>Isolated Digital I\/O<\/td>\n<td>32 input \/ 32 output<\/td>\n<\/tr>\n<tr>\n<td>Switch \/ Measure Unit<\/td>\n<td>Relay &amp; matrix switching &#8211; two 4\u00d732 matrices<\/td>\n<\/tr>\n<tr>\n<td>High-Current Relay<\/td>\n<td>300 VDC \/ 16 A SPST &#8211; 16 ch.<\/td>\n<\/tr>\n<tr>\n<td>RF Mux<\/td>\n<td>500 MHz &#8211; dual 8\u00d71<\/td>\n<\/tr>\n<tr>\n<td style=\"vertical-align: top;\" rowspan=\"2\">Serial<\/td>\n<td>RS-422\/485 \u00d7 4 (50 Mbps)<\/td>\n<\/tr>\n<tr>\n<td>RS-422\/485\/232 \u00d7 32<\/td>\n<\/tr>\n<tr>\n<td>Protocol Adapters<\/td>\n<td>Ethernet, USB 3.0, I2C\/SPI, 1-Wire<\/td>\n<\/tr>\n<tr>\n<td>Video<\/td>\n<td>CameraLink Simulator &amp; Frame Grabber<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div><\/div><div class=\"w-separator size_medium\"><\/div><div class=\"g-cols wpb_row via_grid cols_2 laptops-cols_inherit tablets-cols_inherit mobiles-cols_1 valign_top type_default stacking_default\" style=\"--gap:3rem;\"><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><div class=\"wpb_text_column\"><div class=\"wpb_wrapper\"><h4>Application Areas<\/h4>\n<\/div><\/div><div class=\"w-separator size_small\"><\/div><div class=\"wpb_text_column\"><div class=\"wpb_wrapper\"><ul>\n<li>Avionics &amp; Defense Systems<\/li>\n<li>Serial Production Line (Pass\/Fail)<\/li>\n<li>Card-Level Fault Detection &amp; Repair<\/li>\n<li>Embedded Electronics Testing<\/li>\n<\/ul>\n<\/div><\/div><\/div><\/div><div class=\"wpb_column vc_column_container\"><div class=\"vc_column-inner\"><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/section>\n","protected":false},"featured_media":8479,"template":"","class_list":["post-8482","urunler","type-urunler","status-publish","has-post-thumbnail","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/avies.com\/en\/wp-json\/wp\/v2\/urunler\/8482","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/avies.com\/en\/wp-json\/wp\/v2\/urunler"}],"about":[{"href":"https:\/\/avies.com\/en\/wp-json\/wp\/v2\/types\/urunler"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/avies.com\/en\/wp-json\/wp\/v2\/media\/8479"}],"wp:attachment":[{"href":"https:\/\/avies.com\/en\/wp-json\/wp\/v2\/media?parent=8482"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}